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Title: On a Direct Approach to the Solution of Inverse Optical Problems
Authors: Sharlandjiev, Peter
Stoilov, Georgi
Keywords: Thin Films
Materials and Process Characterization
Physical Sciences and Engineering
Issue Date: 2008
Publisher: Institute of Information Theories and Applications FOI ITHEA
Abstract: The evaluation from experimental data, of physical quantities, which enter into the electromagnetic Maxwell equations, is described as inverse optical problem. The functional relations between the dependent and independent variables are of transcendental character and numeric procedures for evaluation of the unknowns are largely used. Herein, we discuss a direct approach to the solution, illustrated by a specific example of determination of thin films optical constants from spectrophotometric data. New algorithm is proposed for the parameters evaluation, which does not need an initial guess of the unknowns and does not use iterative procedures. Thus we overcome the intrinsic deficiency of minimization techniques, such as gradient search methods, Simplex methods, etc. The price of it is a need of more computing power, but our algorithm is easily implemented in structures such as grid clusters. We show the advantages of this approach and its potential for generalization to other inverse optical problems.
ISSN: 1313-0455
Appears in Collections:Book 5 Intelligent Technologies and Applications

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